۹-۷ فروردین ۸۶ کنفرانس بین المللی مترولوژی در نانوالکترونیک

International Conference on Frontiers of Characterization and Metrology for Nanoelectronics NIST Red Auditorium 100 Bureau Drive Gaithersburg, MD 20899 March 27-29, 2007

Sponsors: National Institute of Standards and Technology (NIST), Sematech, Semiconductor International, National Science Foundation, SEMI, Semiconductor Research Corp. Audience: Scientists and engineers from industry, government, and academia interested in semiconductor metrology for nanoelectronics. Format: Formal invited presentation sessions and poster sessions. Purpose: This conference represents a paradigm shift from the previous conferences in that our emphasis is on frontiers and innovation in characterization and metrology. Our goal is to bring together scientists & engineers interested in all aspects of the technology & characterization techniques for nanoelectronic materials & device research, development, manufacturing, and diagnostics. Topics: Metrology for Nanoelectronics Materials & Devices; Ultra-Shallow Junctions; Dopant Concentrations; Alternate State Devices; Alternative Gate Dielectrics; Thin-Film Nano-Metrology; Interconnects and Barrier Layers; Etch Damage at the Nanoscale; Nanoscale Stress; Nano-Lithography and Bottlenecks; Role of Defects in Nanoelectronics; Nano-Manufacturing and Challenges; Nano-Diagnostics; In-Situ, Real-Time Nano-Control and Monitoring; Integrated Metrology; Critical Analytical Techniques; Novel Measurement Methods, Breakthroughs at the Nanoscale; Contamination, Detection, and Identification; Modeling/Simulation; Nano-Fab Metrology; MEMS/NEMS Metrology Applications; 300 mm Metrology. Technical Contact: David G. Seiler, NIST, Gaitherburg, MD, phone: [phone], e-mail: David G. Seiler Erik Secula, NIST, Gaitherburg, MD, phone: [phone], e-mail: Erik Secula Lori Guariglia, NIST, Gaitherburg, MD, phone: [phone], e-mail: Lori Guariglia Website: www.eeel.nist.gov/812/conference/ Accommodations: A limited block of rooms is reserved at the Gaithersburg Marriott Washingtonian Center, Gaithersburg, Maryland. The room rate will be the prevailing government rate at the time of the conference (approximately $180 plus applicable taxes per night). Reservations must be made by March 8, 2007, to guarantee a room. Rooms at this special rate are available only on a first-come, first-serve basis, so make your reservation early! The phone number for reservations is [phone]. Be sure to idenfity yourself as being with the Frontiers for Nanoelectronics Conference to ensure you receive the reduced rate.

۲۵-۲۳ آبان٬ دوره کوتاه مدت Display Metrology

Display Metrology Short Course National Institute of Standards and Technology (NIST) Boulder, CO November 14 - 16, 2006

Sponsors: National Institute of Standards and Technology (NIST). Audience: The course is designed for scientists, engineers, technicians, and even managers who are involved with making or understanding the complexities of making electronic display measurements. Format: One day lecture, two days laboratory work. Purpose: To teach methods for making display measurements and diagnostics. Topics: Display metrology topics include display measurement methods, problems with expecting too much from your instrumentation, managing stray light, understanding reflection, making robust reflection measurements, and maintaining a measurement laboratory. Registration Contact: Wendy McBride, NIST, Boulder, CO, phone: [phone], fax: [phone], email: Wendy McBride Technical Contact: Edward F. Kelley, NIST, phone: [phone], fax: [phone], email: Edward Kelley Website: www.fpd.nist.gov Registration: On-Line Registration Registration Check-in will be held on Tuesday, November 14 from 7:30 - 8:00 a.m. at the NIST Laboratories, lobby area. Course registration fee: $2000 Fee includes lecture materials, continental breakfasts, lunches and refreshments. Requests for cancellation and refund must be received in writing by October 31, 2006. REGISTRATION DEADLINE: November 8, 2006 FOREIGN VISITORS PLEASE NOTE: If you are a foreign visitor, we will need you to submit additional information to notify the DOC Security of your visit. You must send the following information to Annie Smith at [e-mail]: Gender (male or female) Title/Position Employer Business Address Telephone Date of birth Place of birth (city and country) Passport number and issuing country Citizenship and Country(ies) of Dual Citizenship (if applicable) Country of Current Residence This information is required due to security restrictions on the Department of Commerce campus. If the requested information is not provided one week prior to the start of the meeting, access to the site may be denied. For questions regarding this security policy, please contact Joe Thill at 303-497-3363 or [e-mail]. Accommodations: A limited number of rooms are being held at The Best Western Boulder Inn. Reservations should be made early to ensure the NIST grouop rate. Requests received after October 13, 2006 will be filled on a space available basis. For hotel reservations, please contact: Best Western Boulder Inn 770 28th Street Boulder, CO 80303 303-449-3800 or 800-233-8469 Fax: [phone] Rate: $79 single/double + 10.25% tax Daily rate includes deluxe continental breakfast, free wireless internet access, and full service health club privileges. Additional visitor information is located at: www.boulder.nist.gov/visitor-info.htm

نمایشگاه بین‌المللی کتاب تبریز

ساعت خبر: 10:42 - تاریخ خبر: 04/08/1385

این نمایشگاه باحضور بیش از 900 ناشر داخلی 100, ناشرالکترونیک و 70 ناشرخارجی با بیش از100 هزارعنوان کتاب در محل دائم نمایشگاه بین‌المللی تبریز برگزار خواهد شد. ارائه تازه‌های کتاب , اندیشه‌های نو و افکار جدید از ویژگیها و نمایشگاه‌مطبوعات محلی و مطبوعات یکصدسال اخیر استان و فعالیتهای دفاتر خبرگزاریهااز برنامه‌های جنبی چهارمین نمایشگاه بین‌المللی کتاب تبریز است .