چند نمایشگاه ٬ همایش ٬ و کنفرانس: فروردین ۸۶

2-4 فروردین 1386	ششمین کنفرانس بین المللی ارتباطات از راه دور و انفورماتیک	تگزاس	http://www.wseas.org/conferences/2007/texas/teleinfo
2-4 فروردین 1386	ششمین کنفرانس بین المللی پردازش سیگنال	تگزاس	http://www.wseas.org/conferences/2007/texas/sip
2-4 فروردین 1386	یازدهمین کنفرانس بین المللی ریاضیات کاربردی	تگزاس	http://www.wseas.org/conferences/2007/texas/math/index.html
9-7 فروردین 1386	کنفرانس بین المللی مترولوژی در نانوالکترونیک	کلرادو آمریکا	http://www.nist.gov/public_affairs/confpage/070327.htm
26-28 فروردین 1386	ششمین کنفرانس بین المللی علوم کاربردی کامپیوتر	چین	http://www.wseas.org/conferences/2007/hangzhou/acos
26-28 فروردین 1386	ششمین کنفرانس بین المللی ابزار، اندازه گیری، مدار و سیستم ها	چین	http://www.wseas.org/conferences/2007/hangzhou/imcas
26-28 فروردین 1386	هفنمین کنفرانس بین المللی روباتیک، کنترل و فناوری ساخت	چین	http://www.wseas.org/conferences/2007/hangzhou/rocom
26-28 فروردین 1386	هفتمین کنفرانس بین المللی سیستم های چندرسانه ای و پردازش سیگنال	چین	http://www.wseas.org/conferences/2007/hangzhou/musp
بهار ۸۶	چهارمین کنفرانس آبیاری و زهکشی آسیا و اقیانوسیه	شرکت مدیریت منابع آب ایران	http://www.wrm.ir
بهار ۸۶	همایش دوسالانه انرژی	وزارت نیرو	http://www.iranenergy.org.ir

کنفرانس بین المللی GIS ٬محیط زیست٬ توسعه پایدار آوریل 2007

1 April *   NEW   *	Sydney, Australia	Mapping & 3D Information Extraction from High Resolution Sat. Imagery, Contact: [e-mail]
2-3 April *   NEW   *	Sydney, Australia	Australian Water Summit Sydney 2007, Contact: Shahida Sweeney, [e-mail]
2-5 April *   NEW   *	Amman, Jordan	6th International Symposium on Eastern Mediterranean Geology and 9th International Geological Conference of the Jordanian Geologists Association
4-6 April	Hong Kong, China	Location Asia 2007, Contact: Email
9-11 April	Dubai,  UAE	Map Middle East   Contact: [e-mail]
16-19 April	Ottawa, Canada	April 2007 OGC Technical Committee Meeting
17-20 April	Graz, Austria	Ingenieurvermessung 2007 - 15th International Course on Engineering Surveying
18-19April	Moscow, Russia	Aerial and Satellite Methods and GIS in Silviculture and Forestry - 4th Russian Nation-Wide Conference, (with international inputs), Contact: [e-mail].
23-25April *   NEW   *	Al-Khobar, Saudi Arabia	2nd National GIS Symposium in Saudi ArabiaAbstract deadline: December 2, 2006.Contact: [e-mail].
23-27April	Montreux, Switzerland	Envisat Symposium
25-27April	Novosibirsk, Russia	GEO-SIBERIA 2007 The Third International Exhibition and Scientific Congress, E-mail: [e-mail] and [e-mail]

۹-۷ فروردین ۸۶ کنفرانس بین المللی مترولوژی در نانوالکترونیک

International Conference on Frontiers of Characterization and Metrology for Nanoelectronics NIST Red Auditorium 100 Bureau Drive Gaithersburg, MD 20899 March 27-29, 2007

Sponsors: National Institute of Standards and Technology (NIST), Sematech, Semiconductor International, National Science Foundation, SEMI, Semiconductor Research Corp. Audience: Scientists and engineers from industry, government, and academia interested in semiconductor metrology for nanoelectronics. Format: Formal invited presentation sessions and poster sessions. Purpose: This conference represents a paradigm shift from the previous conferences in that our emphasis is on frontiers and innovation in characterization and metrology. Our goal is to bring together scientists & engineers interested in all aspects of the technology & characterization techniques for nanoelectronic materials & device research, development, manufacturing, and diagnostics. Topics: Metrology for Nanoelectronics Materials & Devices; Ultra-Shallow Junctions; Dopant Concentrations; Alternate State Devices; Alternative Gate Dielectrics; Thin-Film Nano-Metrology; Interconnects and Barrier Layers; Etch Damage at the Nanoscale; Nanoscale Stress; Nano-Lithography and Bottlenecks; Role of Defects in Nanoelectronics; Nano-Manufacturing and Challenges; Nano-Diagnostics; In-Situ, Real-Time Nano-Control and Monitoring; Integrated Metrology; Critical Analytical Techniques; Novel Measurement Methods, Breakthroughs at the Nanoscale; Contamination, Detection, and Identification; Modeling/Simulation; Nano-Fab Metrology; MEMS/NEMS Metrology Applications; 300 mm Metrology. Technical Contact: David G. Seiler, NIST, Gaitherburg, MD, phone: [phone], e-mail: David G. Seiler Erik Secula, NIST, Gaitherburg, MD, phone: [phone], e-mail: Erik Secula Lori Guariglia, NIST, Gaitherburg, MD, phone: [phone], e-mail: Lori Guariglia Website: www.eeel.nist.gov/812/conference/ Accommodations: A limited block of rooms is reserved at the Gaithersburg Marriott Washingtonian Center, Gaithersburg, Maryland. The room rate will be the prevailing government rate at the time of the conference (approximately $180 plus applicable taxes per night). Reservations must be made by March 8, 2007, to guarantee a room. Rooms at this special rate are available only on a first-come, first-serve basis, so make your reservation early! The phone number for reservations is [phone]. Be sure to idenfity yourself as being with the Frontiers for Nanoelectronics Conference to ensure you receive the reduced rate.